Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10079183 | Calculated electrical performance metrics for process monitoring and yield management | Xiang Gao, Philip D. Flanner, III, Leonid Poslavsky, Ming Di, Scott Penner | 2018-09-18 |
| 10013518 | Model building and analysis engine for combined X-ray and optical metrology | Michael S. Bakeman, Andrei V. Shchegrov, Zhengquan Tan | 2018-07-03 |