TP

Todd M. Petit

NI Nanometrics Incorporated: 1 patents #4 of 13Top 35%
Overall (2018): #207,793 of 503,207Top 45%
1
Patents 2018

Issued Patents 2018

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10082461 Optical metrology with purged reference chip Andrew Klassen, Andrew J. Hazelton, Andrew H. Barada, Chuan Sheng Tu 2018-09-25