CT

Chuan Sheng Tu

NI Nanometrics Incorporated: 1 patents #4 of 13Top 35%
📍 Zhubei City, TW: #91 of 249 inventorsTop 40%
Overall (2018): #454,617 of 503,207Top 95%
1
Patents 2018

Issued Patents 2018

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10082461 Optical metrology with purged reference chip Andrew Klassen, Andrew J. Hazelton, Andrew H. Barada, Todd M. Petit 2018-09-25