Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9966227 | Specimen observation method and device using secondary emission electron and mirror electron detection | Masahiro Hatakeyama, Takeshi Murakami, Yoshihiko Naito, Kenji Terao, Kenji Watanabe | 2018-05-08 |