Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10002740 | Inspection device | Masahiro Hatakeyama, Ryo Tajima, Kenichi Suematsu, Kenji Watanabe, Yasushi Toma +1 more | 2018-06-19 |
| 9966227 | Specimen observation method and device using secondary emission electron and mirror electron detection | Masahiro Hatakeyama, Takeshi Murakami, Yoshihiko Naito, Norio Kimura, Kenji Watanabe | 2018-05-08 |