Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10157722 | Inspection device | Masahiro Hatakeyama, Shoji Yoshikawa, Takeshi Murakami, Kenji Watanabe, Yasushi Toma +5 more | 2018-12-18 |
| 9966227 | Specimen observation method and device using secondary emission electron and mirror electron detection | Masahiro Hatakeyama, Takeshi Murakami, Kenji Terao, Norio Kimura, Kenji Watanabe | 2018-05-08 |