Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10157722 | Inspection device | Shoji Yoshikawa, Takeshi Murakami, Kenji Watanabe, Yoshihiko Naito, Yasushi Toma +5 more | 2018-12-18 |
| 10002740 | Inspection device | Ryo Tajima, Kenichi Suematsu, Kenji Watanabe, Yasushi Toma, Kenji Terao +1 more | 2018-06-19 |
| 9966227 | Specimen observation method and device using secondary emission electron and mirror electron detection | Takeshi Murakami, Yoshihiko Naito, Kenji Terao, Norio Kimura, Kenji Watanabe | 2018-05-08 |