Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10157722 | Inspection device | Masahiro Hatakeyama, Takeshi Murakami, Kenji Watanabe, Yoshihiko Naito, Yasushi Toma +5 more | 2018-12-18 |
| 10074510 | Inspection system and inspection image data generation method | Kenichi Suematsu | 2018-09-11 |