Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10056224 | Method and system for edge-of-wafer inspection and review | Xinrong Jiang, Christopher Sears, David Trease, David Kaz, Wei Ye | 2018-08-21 |
| 9922269 | Method and system for iterative defect classification | Sankar Venkataraman, Li He, John R. Jordan, Oksen Baris | 2018-03-20 |
| 9898811 | Method and system for defect classification | Li He, Chien-Huei Chen, Sankar Venkataraman, John R. Jordan, Huajun Ying | 2018-02-20 |