Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10056224 | Method and system for edge-of-wafer inspection and review | Xinrong Jiang, Christopher Sears, Harsh Sinha, David Trease, Wei Ye | 2018-08-21 |
| 10018579 | System and method for cathodoluminescence-based semiconductor wafer defect inspection | Sameet K. Shriyan, Hong Xiao | 2018-07-10 |