Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10018579 | System and method for cathodoluminescence-based semiconductor wafer defect inspection | Sameet K. Shriyan, David Kaz | 2018-07-10 |
| 10020979 | Allocating resources in multi-core computing environments | Dennis Oshiba | 2018-07-10 |