Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9922269 | Method and system for iterative defect classification | Sankar Venkataraman, Li He, Oksen Baris, Harsh Sinha | 2018-03-20 |
| 9898811 | Method and system for defect classification | Li He, Chien-Huei Chen, Sankar Venkataraman, Huajun Ying, Harsh Sinha | 2018-02-20 |