Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10146036 | Semiconductor wafer inspection using care area group-specific threshold settings for detecting defects | Parul Dhagat, Ananthan Raghunathan, Vikas Sachan | 2018-12-04 |
| 10042973 | Expansion of allowed design rule space by waiving benign geometries | Ioana Graur | 2018-08-07 |