Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10146036 | Semiconductor wafer inspection using care area group-specific threshold settings for detecting defects | Parul Dhagat, Ananthan Raghunathan, Dmitry Vengertsev | 2018-12-04 |