Issued Patents 2018
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10146036 | Semiconductor wafer inspection using care area group-specific threshold settings for detecting defects | Parul Dhagat, Vikas Sachan, Dmitry Vengertsev | 2018-12-04 |
| 10114921 | Method and recording medium of reducing chemoepitaxy directed self-assembled defects | Michael A. Guillorn, Kafai Lai, Chi-Chun Liu, HsinYu Tsai | 2018-10-30 |