AK

Andrew Klassen

NI Nanometrics Incorporated: 1 patents #4 of 13Top 35%
Overall (2018): #487,281 of 503,207Top 100%
1
Patents 2018

Issued Patents 2018

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
10082461 Optical metrology with purged reference chip Andrew J. Hazelton, Andrew H. Barada, Todd M. Petit, Chuan Sheng Tu 2018-09-25