Issued Patents 2018
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10088524 | Logic built in self test circuitry for use in an integrated circuit with scan chains | Satya R. S. Bhamidipati, Mary P. Kusko, Cedric Lichtenau | 2018-10-02 |
| 10060971 | Adjusting latency in a scan cell | Steven M. Douskey, Mary P. Kusko | 2018-08-28 |
| 10001523 | Adjusting latency in a scan cell | Steven M. Douskey, Mary P. Kusko | 2018-06-19 |
| 9934348 | Adjusting scan connections based on scan control locations | Ankit N. Kagliwal, Sridhar H. Rangarajan, James D. Warnock | 2018-04-03 |