Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10088524 | Logic built in self test circuitry for use in an integrated circuit with scan chains | Raghu G. GopalaKrishnaSetty, Mary P. Kusko, Cedric Lichtenau | 2018-10-02 |
| 10018671 | Reducing power requirements and switching during logic built-in-self-test and scan test | Mary P. Kusko, Cedric Lichtenau | 2018-07-10 |
| 10018672 | Reducing power requirements and switching during logic built-in-self-test and scan test | Mary P. Kusko, Cedric Lichtenau | 2018-07-10 |