Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10008421 | Capacitance monitoring using x-ray diffraction | Donghun Kang, Oh-Jung Kwon, Anita Madan, Conal E. Murray | 2018-06-26 |
| 9892979 | Non-destructive dielectric layer thickness and dopant measuring method | Sean M. Polvino | 2018-02-13 |
| 9870960 | Capacitance monitoring using X-ray diffraction | Donghun Kang, Oh-Jung Kwon, Anita Madan, Conal E. Murray | 2018-01-16 |