Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10008421 | Capacitance monitoring using x-ray diffraction | Donghun Kang, Kriteshwar K. Kohli, Oh-Jung Kwon, Conal E. Murray | 2018-06-26 |
| 9870960 | Capacitance monitoring using X-ray diffraction | Donghun Kang, Kriteshwar K. Kohli, Oh-Jung Kwon, Conal E. Murray | 2018-01-16 |