Issued Patents 2018
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10079185 | Semiconductor pattern for monitoring overlay and critical dimension at post-etching stage and metrology method of the same | Chien-Hao Chen, Chia-Hung Wang, Sho-Shen Lee | 2018-09-18 |
| 10015902 | Integrated moveable and lockable rail | Chao-Jung Chen, Chih-Wei Lin | 2018-07-03 |
| 9916523 | Automatic picture classifying system and method in a dining environment | — | 2018-03-13 |