Issued Patents 2018
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10079185 | Semiconductor pattern for monitoring overlay and critical dimension at post-etching stage and metrology method of the same | Chien-Hao Chen, Chien-Wei Huang, Sho-Shen Lee | 2018-09-18 |
| 10017965 | Chain lock | — | 2018-07-10 |
| 9981030 | Glycan conjugates and use thereof | Chi-Huey Wong, Chung-Yi Wu, Shiou-Ting Li | 2018-05-29 |
| 9964866 | Method of forming integrated circuit | Che-Yi Lin, En-Chiuan Liou, Chia-Hsun Tseng, Yi-Ting Chen, Yi-Jing Wang | 2018-05-08 |