Issued Patents 2018
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10001711 | Inspection method, lithographic apparatus, mask and substrate | Youri Johannes Laurentius Maria Van Dommelen, Peter David Engblom, Arie Jeffrey Den Boef, Kaustuve Bhattacharyya, Paul Christiaan Hinnen +1 more | 2018-06-19 |