KT

Kiyoshi Takamasu

HH Hitachi High-Technologies: 1 patents #155 of 435Top 40%
TT The University Of Tokyo: 1 patents #61 of 304Top 25%
Overall (2017): #344,284 of 506,227Top 70%
1
Patents 2017

Issued Patents 2017

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9733194 Method for reviewing a defect and apparatus Yuko Otani, Shunji Maeda, Yuta Urano, Toshifumi Honda, Takehiro Hirai +1 more 2017-08-15