Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9646128 | System and method for validating stacked dies by comparing connections | Ashok Mehta, Kai-Yuan Ting, Sandeep Kumar Goel, Chao-Yang Yeh | 2017-05-09 |
| 9633147 | Power state coverage metric and method for estimating the same | Sandeep Kumar Goel, Tze-Chiang Huang, Yun-Han Lee | 2017-04-25 |
| 9612277 | System and method for functional verification of multi-die 3D ICs | Ashok Mehta, Sandeep Kumar Goel, Kai-Yuan Ting | 2017-04-04 |