Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9786569 | Overlay measurement and compensation in semiconductor fabrication | Wei-De Ho, Shu-Hong Lin, Ya Hui Chang, Chang-Yi Tsai, Tsung-Lin Yang +1 more | 2017-10-10 |
CC
Chih-Jung Chiang
Overall (2017): #467,151 of 506,227Top 95%
1
Patents 2017