Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9786569 | Overlay measurement and compensation in semiconductor fabrication | Wei-De Ho, Shu-Hong Lin, Ya Hui Chang, Chih-Jung Chiang, Chang-Yi Tsai +1 more | 2017-10-10 |
TY
Tsung-Lin Yang
Overall (2017): #208,711 of 506,227Top 45%
1
Patents 2017