Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9851389 | Identifying components associated with a fault in a plasma system | — | 2017-12-26 |
| 9720022 | Systems and methods for providing characteristics of an impedance matching model for use with matching networks | Arthur M. Howald, Bradford J. Lyndaker, John C. Valcore, Jr. | 2017-08-01 |
| 9620334 | Control of etch rate using modeling, feedback and impedance match | Bradford J. Lyndaker, John C. Valcore, Jr., Alexei Marakhtanov, Zhigang Chen | 2017-04-11 |