Issued Patents 2017
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9841689 | Approach for model calibration used for focus and dose measurement | Vladimir Levinski, Daniel Kandel, Nadav Gutman | 2017-12-12 |
| 9739702 | Symmetric target design in scatterometry overlay metrology | Barak Bringoltz, Daniel Kandel, Noam Sapiens, Irina Paykin, Alexander Svizher +4 more | 2017-08-22 |
| 9581430 | Phase characterization of targets | Amnon Manassen, Ohad Bachar, Daria Negri, Boris Golovanevsky, Barak Bringoltz +8 more | 2017-02-28 |