Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9558545 | Predicting and controlling critical dimension issues and pattern defectivity in wafers using interferometry | Pradeep Vukkadala, Sathish Veeraraghavan, Jaydeep Sinha | 2017-01-31 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9558545 | Predicting and controlling critical dimension issues and pattern defectivity in wafers using interferometry | Pradeep Vukkadala, Sathish Veeraraghavan, Jaydeep Sinha | 2017-01-31 |