Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9615803 | System and method for determining X-ray exposure parameters | Yun Zou, Scott Stephen Zelakiewicz, Floribertus P. M. Heukensfeldt Jansen, Mark Alan Frontera, Uwe Wiedmann +1 more | 2017-04-11 |
| 9610057 | System and method for determining X-ray exposure parameters | Yun Zou, David Allen Langan, Hao Lai, John Michael Sabol, Guillermo Sander | 2017-04-04 |