Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9610057 | System and method for determining X-ray exposure parameters | Yun Zou, David Allen Langan, Hao Lai, Rowland Frederick Saunders, John Michael Sabol | 2017-04-04 |
GS
Guillermo Sander
Overall (2017): #410,693 of 506,227Top 85%
1
Patents 2017