Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9610057 | System and method for determining X-ray exposure parameters | Yun Zou, David Allen Langan, Rowland Frederick Saunders, John Michael Sabol, Guillermo Sander | 2017-04-04 |
HL
Hao Lai
Overall (2017): #408,151 of 506,227Top 85%
1
Patents 2017