Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date | Approx Value ⓘ |
|---|---|---|---|---|
| 9615803 | System and method for determining X-ray exposure parameters | Yun Zou, Rowland Frederick Saunders, Floribertus P. M. Heukensfeldt Jansen, Mark Alan Frontera, Uwe Wiedmann +1 more | 2017-04-11 | $16,578,000 |