Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9615803 | System and method for determining X-ray exposure parameters | Yun Zou, Rowland Frederick Saunders, Floribertus P. M. Heukensfeldt Jansen, Mark Alan Frontera, Uwe Wiedmann +1 more | 2017-04-11 |
SZ
Scott Stephen Zelakiewicz
Overall (2017): #250,512 of 506,227Top 50%
1
Patents 2017