Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9576861 | Method and system for universal target based inspection and metrology | Allen Park, Ellis Chang, Michael Adel, Ady Levy, Amir Widmann +2 more | 2017-02-21 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9576861 | Method and system for universal target based inspection and metrology | Allen Park, Ellis Chang, Michael Adel, Ady Levy, Amir Widmann +2 more | 2017-02-21 |