Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9816940 | Wafer inspection with focus volumetric method | Grace Hsiu-Ling Chen, Markus Huber, Se Baek Oh | 2017-11-14 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9816940 | Wafer inspection with focus volumetric method | Grace Hsiu-Ling Chen, Markus Huber, Se Baek Oh | 2017-11-14 |