Issued Patents 2017
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9818887 | Back-illuminated sensor with boron layer | Jehn-Huar Chern, Ali R. Ehsani, Gildardo Delgado, Yung-Ho Alex Chuang, John Fielden | 2017-11-14 |
| 9793673 | Semiconductor inspection and metrology system using laser pulse multiplier | Yung-Ho Alex Chuang, J. Joseph Armstrong, Justin Dianhuan Liou, Vladimir Dribinski | 2017-10-17 |
| 9767986 | Scanning electron microscope and methods of inspecting and reviewing samples | Yung-Ho Alex Chuang, John Fielden, Marcel Trimpl, Jingjing Zhang, Devis Contarato +1 more | 2017-09-19 |
| 9748294 | Anti-reflection layer for back-illuminated sensor | Masaharu Muramatsu, Hisanori Suzuki, Yasuhito Yoneta, Shinya Otsuka, Jehn-Huar Chem +3 more | 2017-08-29 |
| 9620341 | Photomultiplier tube, image sensor, and an inspection system using a PMT or image sensor | Yung-Ho Alex Chuang, John Fielden | 2017-04-11 |