Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9720040 | Timing-aware test generation and fault simulation | Xijiang Lin, Kun-Han Tsai, Mark Kassab, Janusz Rajski | 2017-08-01 |
| 9651622 | Isometric test compression with low toggling activity | Janusz Rajski, Amit Amar Kumar, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee +1 more | 2017-05-16 |