Issued Patents 2017
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9831110 | Vision-based wafer notch position measurement | Gustavo G. Francken, Peter Thaulad, Zhuozhi Chen, Richard K. Lyons, Christian DiPietro +1 more | 2017-11-28 |
| 9779977 | End effector assembly for clean/dirty substrate handling | Ross Embertson, Austin Ngo, Matthew J. Rodnick | 2017-10-03 |
| 9698036 | Stacked wafer cassette loading system | Silvia Aguilar, Scott Wong, Derek John Witkowicki, Richard H. Gould, Candi Kristoffersen | 2017-07-04 |
| 9536764 | End effector for wafer transfer system and method of transferring wafers | Ross Embertson | 2017-01-03 |