Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9831110 | Vision-based wafer notch position measurement | Gustavo G. Francken, Brandon Senn, Zhuozhi Chen, Richard K. Lyons, Christian DiPietro +1 more | 2017-11-28 |
PT
Peter Thaulad
Overall (2017): #280,648 of 506,227Top 60%
1
Patents 2017