Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9576861 | Method and system for universal target based inspection and metrology | Ellis Chang, Michael Adel, Kris Bhaskar, Ady Levy, Amir Widmann +2 more | 2017-02-21 |
| 9536299 | Pattern failure discovery by leveraging nominal characteristics of alternating failure modes | — | 2017-01-03 |