Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9829448 | Measurement of small features using XRF | Matthew Wormington, Isaac Mazor, Alex Tokar | 2017-11-28 |
| 9606073 | X-ray scatterometry apparatus | Isaac Mazor, Alex Krokhmal, Matthew Wormington | 2017-03-28 |