Issued Patents 2017
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9829448 | Measurement of small features using XRF | Isaac Mazor, Alex Tokar, Alex Dikopoltsev | 2017-11-28 |
| 9726624 | Using multiple sources/detectors for high-throughput X-ray topography measurement | Paul Ryan, John Leonard Wall | 2017-08-08 |
| 9666322 | X-ray source assembly | Isaac Mazor, Asher Peled, Alex Brandt | 2017-05-30 |
| 9606073 | X-ray scatterometry apparatus | Isaac Mazor, Alex Krokhmal, Alex Dikopoltsev | 2017-03-28 |