Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9829448 | Measurement of small features using XRF | Matthew Wormington, Isaac Mazor, Alex Dikopoltsev | 2017-11-28 |
| 9632043 | Method for accurately determining the thickness and/or elemental composition of small features on thin-substrates using micro-XRF | Isaac Mazor, Fouad Atrash, Olga Ostrovsky | 2017-04-25 |