| 9762213 |
Initializing scannable and non-scannable latches from a common clock buffer |
Ricardo H. Nigaglioni, Hagen Schmidt, James D. Warnock |
2017-09-12 |
| 9762212 |
Initializing scannable and non-scannable latches from a common clock buffer |
Ricardo H. Nigaglioni, Hagen Schmidt, James D. Warnock |
2017-09-12 |
| 9753076 |
Voltage rail monitoring to detect electromigration |
David D. Cadigan, Adam J. McPadden, Anuwat Saetow, Gary A. Tressler |
2017-09-05 |
| 9746516 |
Collecting diagnostic data from chips |
Steven M. Douskey, Ryan A. Fitch, Mary P. Kusko |
2017-08-29 |
| 9697910 |
Multi-match error detection in content addressable memory testing |
Pradip Patel, Daniel Rodko |
2017-07-04 |
| 9627012 |
Shift register with opposite shift data and shift clock directions |
Norman K. James, Pradip Patel, Daniel Rodko |
2017-04-18 |
| 9557381 |
Physically aware insertion of diagnostic circuit elements |
Mary P. Kusko, Sridhar H. Rangarajan, Robert C. Redburn, Andrew A. Turner |
2017-01-31 |
| 9548773 |
Mitigation of EMI/ESD-caused transmission errors on an electronic circuit |
David D. Cadigan, Samuel R. Connor, Michael A. Cracraft, Adam J. McPadden, Anuwat Saetow +1 more |
2017-01-17 |
