| 9746516 |
Collecting diagnostic data from chips |
Ryan A. Fitch, William V. Huott, Mary P. Kusko |
2017-08-29 |
| 9726723 |
Scan chain processing in a partially functional chip |
Ronald Edward Fuhs |
2017-08-08 |
| 9575120 |
Scan chain processing in a partially functional chip |
Ronald Edward Fuhs |
2017-02-21 |
| 9568549 |
Managing redundancy repair using boundary scans |
Ryan A. Fitch, Michael J. Hamilton, Amanda R. Kaufer |
2017-02-14 |
| 9557383 |
Partitioned scan chain diagnostics using multiple bypass structures and injection points |
Michael J. Hamilton, Amanda R. Kaufer |
2017-01-31 |
| 9551747 |
Inserting bypass structures at tap points to reduce latch dependency during scan testing |
Michael J. Hamilton, Amanda R. Kaufer |
2017-01-24 |
| 9547039 |
Inserting bypass structures at tap points to reduce latch dependency during scan testing |
Michael J. Hamilton, Amanda R. Kaufer |
2017-01-17 |
