Issued Patents 2017
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9678152 | Scan chain latch design that improves testability of integrated circuits | Dzmitry S. Maliuk, Franco Stellari, Alan J. Weger | 2017-06-13 |
| 9581642 | Method and system for quickly identifying circuit components in an emission image | Franco Stellari | 2017-02-28 |
| 9568540 | Method for the characterization and monitoring of integrated circuits | Raphael P. Robertazzi, Franco Stellari | 2017-02-14 |
| 9557369 | Integrated time dependent dielectric breakdown reliability testing | Jifeng Chen, Dirk Pfeiffer, Thomas M. Shaw, Franco Stellari | 2017-01-31 |