Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9678152 | Scan chain latch design that improves testability of integrated circuits | Franco Stellari, Alan J. Weger, Peilin Song | 2017-06-13 |
DM
Dzmitry S. Maliuk
Overall (2017): #434,844 of 506,227Top 90%
1
Patents 2017