Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9678152 | Scan chain latch design that improves testability of integrated circuits | Dzmitry S. Maliuk, Franco Stellari, Peilin Song | 2017-06-13 |
AW
Alan J. Weger
Overall (2017): #495,123 of 506,227Top 100%
1
Patents 2017