Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9557369 | Integrated time dependent dielectric breakdown reliability testing | Dirk Pfeiffer, Thomas M. Shaw, Peilin Song, Franco Stellari | 2017-01-31 |
JC
Jifeng Chen
Overall (2017): #376,713 of 506,227Top 75%
1
Patents 2017